2000
DOI: 10.1002/1521-3951(200009)221:1<425::aid-pssb425>3.0.co;2-u
|View full text |Cite
|
Sign up to set email alerts
|

100 fs Carrier Dynamics in GaAs under 100 nm Diameter Apertures

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
1
0
1

Year Published

2002
2002
2024
2024

Publication Types

Select...
5
1
1

Relationship

0
7

Authors

Journals

citations
Cited by 8 publications
(2 citation statements)
references
References 10 publications
0
1
0
1
Order By: Relevance
“…First attempts towards this goal were based on time-and space-resolved pump-probe experiments. [11,12] But since the nonlinear response of the semiconductor was tested, only high-density regimes beyond the excitonic phase were accessible. We will show in this letter, that we are able to investigate the spatial coherence and measure the coherence length of excitons using spatially resolved phonon sideband spectroscopy in quantum wells based on the polar semiconductor ZnSe.…”
mentioning
confidence: 99%
“…First attempts towards this goal were based on time-and space-resolved pump-probe experiments. [11,12] But since the nonlinear response of the semiconductor was tested, only high-density regimes beyond the excitonic phase were accessible. We will show in this letter, that we are able to investigate the spatial coherence and measure the coherence length of excitons using spatially resolved phonon sideband spectroscopy in quantum wells based on the polar semiconductor ZnSe.…”
mentioning
confidence: 99%
“…Erst in jüngerer Vergangenheit hat man versucht, die hohe zeitliche Auflösung der fs-Spektroskopie mit der hohen räumlichen Auflösung von mikroskopischen Techniken zu verknüpfen [Koc00]. So wurden für die zeitaufgelöste Untersuchung des lateralen Transportes (parallel zur Probenoberfläche) optisch angeregter Ladungsträger Methoden der optischen Nahfeldmikroskopie [Gro98,Ent00], der konfokalen Mikroskopie [Vol99] und auch Maskentechniken [Het00] eingesetzt. In dieser Arbeit wird nun eine Methode vorgestellt, die die Untersuchung des Ladungsträgertransportes nicht parallel sondern senkrecht zur Probenoberfläche mit einer sub-µm räumlichen und sub-ps zeitlichen Auflösung ermöglicht.…”
unclassified