2022
DOI: 10.5540/tcam.2022.023.04.00749
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A Novel In Silico Monte Carlo Approach to Optimize a PSD Estimation Problem. Generation of Data Fusion Experiment Rules

Abstract: This article analyzes the performance of combining information from Scanning Electron Microscopy (SEM) micrographs with Static Light Scattering (SLS) measurements for retrieving the so-called Particle Size Distribution (PSD) in terms of experimental features. The corresponding data fusion is implemented using a novel Monte Carlo-based method consisting in a SMF (Sampling-Mapping-Filtering) approach. This approach provides an important reference to assess the strategy of the experiment for this specific problem… Show more

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Cited by 1 publication
(2 citation statements)
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References 21 publications
(29 reference statements)
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“…A statistical methodology for solving an inverse problem in the form of a Fredholm integral equation was proposed in [6]. This methodology is basically a Sequential Monte Carlo (SMC) technique which can be described as a three-step Sampling-Mapping-Filtering (SMF) strategy to building a posterior histogram for the parameters of interest.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…A statistical methodology for solving an inverse problem in the form of a Fredholm integral equation was proposed in [6]. This methodology is basically a Sequential Monte Carlo (SMC) technique which can be described as a three-step Sampling-Mapping-Filtering (SMF) strategy to building a posterior histogram for the parameters of interest.…”
Section: Introductionmentioning
confidence: 99%
“…The optimization involved in the PRI can be treated as a regularization procedure with a regularization parameter to be chosen. Here, we are concerned with the analysis of the results of applying a simplified version of this optimization scheme in numerical examples similar to the ones studied in [6]. These examples correspond to a spherical particle size distribution (PSD) estimation problem posed as a data fusion from two experimental sources: Scanning Electron Microscopy (SEM) and Static Light Scattering (SLS) measurements.…”
Section: Introductionmentioning
confidence: 99%