Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References

Both, Thiago Hanna; Colombo, Dalton Martini; Dallasen, Ricardo Vanni; Wirth, Gilson

doi:10.5028/jatm.v5i3.227

J.Aerosp. Technol. Manag.

2013

DOI: 10.5028/jatm.v5i3.227

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Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References

Thiago Hanna Both

Dalton Martini Colombo

Ricardo Vanni Dallasen

et al.

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Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References

Cited by 1 publication

References 14 publications

Automated analysis of propagation induced pulse broadening of single event transients

Automated analysis of propagation induced pulse broadening of single event transients

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