Compiler Optimizations Impact the Reliability of the Control-Flow of Radiation-Hardened Software

Abstract

This paper discusses how compiler optimizations influence software reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation-induced control-flow errors. Supported by a comprehensive fault-injection campaign using an established benchmark suite in the embedded systems domain, we show that the compiler is a non-negligible source of noise when hardening the software against radiationinduced soft errors.