2007
DOI: 10.1590/s1678-58782007000100008
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In-situ raman spectroscopy analysis of re-crystallization annealing of diamond turned silicon crystal

Abstract: Mechanical material removal during ultraprecision machining of semiconductors crystals normally induces surface damage. In this article, Raman micro-spectroscopy has been used to probe structural alteration as well as residual stresses in the machined surface generated by single point diamond turning. The damage found is characterized by an amorphous phase in the outmost surface layer. In addition, it is reported, for the first time, the results of in-situ re-crystallization annealing of micromachined silicon … Show more

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Cited by 8 publications
(8 citation statements)
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References 11 publications
(9 reference statements)
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“…After annealing, the previously shiny surfaces took on a matte appearance, signifying that the surface roughness increased upon annealing. Similar effects have been characterized previously (Jasinevicius et al, 2007). Etching was performed with an acid mixture that was 60 parts nitric acid to one part hydrofluoric acid by volume, following a similar prescription to the one given by Zawisky et al (2010).…”
Section: Fabrication Processmentioning
confidence: 98%
“…After annealing, the previously shiny surfaces took on a matte appearance, signifying that the surface roughness increased upon annealing. Similar effects have been characterized previously (Jasinevicius et al, 2007). Etching was performed with an acid mixture that was 60 parts nitric acid to one part hydrofluoric acid by volume, following a similar prescription to the one given by Zawisky et al (2010).…”
Section: Fabrication Processmentioning
confidence: 98%
“…Longer machining time requires an improved temperature stability of the work environment to avoid a degrading of accuracy of the machined shape. The schematic illustration of machining geometry with a round nose tool is depicted in [6]. We can calculate a theoretical profile, which is produced using the round nose tool with a given radius.…”
Section: Nano-machining Setupmentioning
confidence: 99%
“…This study showed the possibility of the effective and inexpensive use of a method to produce mechanically flexible nanoribbons and fibers for nano and micromechanical and electronic devices. The [24,53,80,81,84,[87][88][89][90][91][92] publications also report the analysis of the chip formation made when studied the ductile mode cutting. Typical electron microscopic images of amorphous chips of silicon [76,81,88] and CaF 2 [90] are presented in Fig.…”
Section: Chips Formation and Structure In Dictile Mode Cutting Of Brimentioning
confidence: 99%
“…7. It should be noted that in studying the chip phase composition as well as the machined surface of semiconductors [1,23,24,74,86,88,89,92,93] the Raman spectroscopy is widely used and not the trans mission electron microscopy, which was widely used in earlier studies [94,95] referring to the ductile mode of cutting semiconductors. The Raman spectroscopy makes it possible to diagnose virtually all existing phases of semiconductors, a labor consuming procedure for the sample preparation is not required and the investiga tions are conducted at ordinary conditions, without the use of vacuum chambers.…”
Section: Chips Formation and Structure In Dictile Mode Cutting Of Brimentioning
confidence: 99%
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