2010
DOI: 10.1590/s0370-44672010000100022
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Modificações estruturais induzidas por hidrogenação catódica em aço austenítico soldado e nitretado a plasma

Abstract: ResumoNesse trabalho, apresentamos a caracterização estrutural de regiões soldadas em aço austenítico AISI-304, que foram submetidas a processo de nitretação a plasma (20%N 2 + 80%H 2 ). Posteriormente as amostras foram hidrogenadas catodicamente. As temperaturas de nitretação foram de 400, 500 e 550°C. As regiões da solda e fora da solda hidrogenadas após a nitretação foram comparadas por DRX, microscopia ótica e microscopia eletrônica de varredura (MEV). As fases austenita-, martensita-', martensita-, fer… Show more

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Cited by 2 publications
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“…Based on these cards, the XRD theoretical profile with its specific positions was modeled. The parameters obtained with refinement: R p (%) = 5.770, R exp (%) = 2.873, R wp (%) = 7.608, χ 2 = 6.416 and GOF = 2.533, prove this agreement 23,48 . The experimental lattice parameters, atomic positions, and positions occupancy calculated by the Rietveld refinement method 23,41 are presented in Table 5.…”
Section: X-ray Diffraction (Xrd) Analysissupporting
confidence: 60%
See 1 more Smart Citation
“…Based on these cards, the XRD theoretical profile with its specific positions was modeled. The parameters obtained with refinement: R p (%) = 5.770, R exp (%) = 2.873, R wp (%) = 7.608, χ 2 = 6.416 and GOF = 2.533, prove this agreement 23,48 . The experimental lattice parameters, atomic positions, and positions occupancy calculated by the Rietveld refinement method 23,41 are presented in Table 5.…”
Section: X-ray Diffraction (Xrd) Analysissupporting
confidence: 60%
“…The peaks positions are in accordance with the results published in the Inorganic Crystal Structure Database (ICSD), cards N° 31901 44 , 76667 45 , 654542 49 , 53146 47 and 31156 50 , the XRD theorical profile with its specific positions was modeled from these cards. The parameters obtained with the refinement: Rp (%) = 4.560, Rexp (%) = 3.623, Rwp (%) = 6.568, χ2 = 3.287 and GOF = 1.813, prove the agreement 23, 48 . The experimental lattices, atomics positions and positions occupancy calculated by Rietveld refinement method 23,41 are presented in Table 4.…”
Section: X-ray Diffraction (Xrd) Analysissupporting
confidence: 57%