2006
DOI: 10.1590/s0101-82052006000200003
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A regularized solution with weighted Bregman distances for the inverse problem of photoacoustic spectroscopy

Abstract: Abstract. In the present work we propose the use of weighted Bregman distances in the construction of regularization terms for the Tikhonov functional applied for the formulation and solution of the inverse problem of photoacoustic spectroscopy. Test case results demonstrate that better estimates were obtained for the simultaneous estimation of the thermal diffusivity and optical absorption coefficient using, as synthetic experimental data, the information on both the amplitude and phase-lag of the temperature… Show more

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Cited by 6 publications
(2 citation statements)
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“…In this paper we focus on investigating the latter two aspects. Though the structural characterization on which local mechanical properties depend also plays a vital role in inverse problems arising from nanotechnology (see, e.g., Mlinar et al [14], Cidade et al [7,18] and Li et al [11]), it is beyond the scope of this paper. Before proceeding to propose the new model, we review some widely used models for quantitative study of mechanical properties of one dimension uniform nanomaterials.…”
Section: Introductionmentioning
confidence: 99%
“…In this paper we focus on investigating the latter two aspects. Though the structural characterization on which local mechanical properties depend also plays a vital role in inverse problems arising from nanotechnology (see, e.g., Mlinar et al [14], Cidade et al [7,18] and Li et al [11]), it is beyond the scope of this paper. Before proceeding to propose the new model, we review some widely used models for quantitative study of mechanical properties of one dimension uniform nanomaterials.…”
Section: Introductionmentioning
confidence: 99%
“…The atomic force microscope (AFM) and the scanning tunneling microscope (STM) are two versions of scanning probes utilized in nanotechnology, which have made it possible to see structures and deformation at the nanoscale in real space. Though structural characterization on which local mechanical properties depend plays a vital role in inverse problems arising from nanotechnology, Mlinar et al [25], Cidade and Silva et al [9,32] and Li et al [20], we do not intend to discuss it in this paper. Instead, we focus on quantifying the elastic modulus from AFM measurements, which is considered as one of many steps in nanotechnology.…”
Section: Introductionmentioning
confidence: 99%