Scanning electron microscopy and X-ray spectroscopy applied to mycelial phase of sporothrix schenckii

Abstract

Scanning electron microscopy applied to lhe mycelial phase of Sporothrix schenckii shcws a m atted mycelium with conidia of a regular pattern. X-Ray microanalysis applied in energy dispersive spectroscopy and also in wavelength dispersive spectroscopy reveals the presence of several elements of M endeleefs classification.