Investigation on Electrical Properties and Microdefects of Nb5+-Doped BaTiO3 Based Ceramics by Positron Annihilation Techniques

Cheng, Xiang; Wang, Yuxin; Chen, Xiaoming; Cui, Haining

doi:10.1590/1980-5373-mr-2018-0921

Cited by 2 publications

(1 citation statement)

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“…Thus, the K + ions enter the nucleation sites and enhance grain growth, leading to increased grain sizes 41 . With a K concentration of 0.20 moles, the average grain size is reduced because of grain growth inhibition in the samples by secondary phases, as reported in other researchers 26,42,43 . The elemental analysis clearly reveals K, Cr, Ni and O components from EDX mapping at 3500× magnification (Figure 4).…”

Section: Resultssupporting

confidence: 73%

Structures and Properties of KxCryNi1-x-yO Dielectric Materials Prepared by an Ultrasonic-Assisted Sol-Gel Method

et al. 2021

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K x Cr y Ni 1-x-y O (x = 0.05-0.20, y = 0.02) dielectric materials were prepared using a facile simple green ultrasonic-assisted sol-gel method. All samples have a main phase consisting of a cubic NiO structure and with nanoscale crystallite sizes (28.58-37.51 nm). However, secondary phases were also observed for the samples with x values exceeding 0.10. The fractured surface microstructures of the samples with x values less than 0.15 exhibited uniformly distributed spherical grains. Other samples showed irregularly shaped grains. The grain sizes were larger when x was increased to 0.15 and exhibited increased grain growth probably due to substitution of K ions into the NiO lattice. However, a reduction of grain sizes was observed in the sample with x = 0.20, possibly due to inhibition of the grain growth by the secondary phase. At room temperature and a frequency of 1013 Hz, the highest dielectric constant of 2.25 × 10 4 was obtained for the samples with x = 0.15.

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Section: Resultssupporting

confidence: 73%