2006
DOI: 10.1021/ac069407y
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Analytical Challenges in Molecular Electronics

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Cited by 44 publications
(47 citation statements)
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References 37 publications
(52 reference statements)
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“…There are also clear cases of structural control of electronic conductance for mesoscale and ensemble junctions (e.g., see Fig. 7,8,9,12,14,16,and 17). In some cases, the observed conductance of an ensemble junction varies by orders of magnitude when the only known structural change is the thickness or identity of the molecular layer.…”
Section: Where Are We Now?mentioning
confidence: 96%
“…There are also clear cases of structural control of electronic conductance for mesoscale and ensemble junctions (e.g., see Fig. 7,8,9,12,14,16,and 17). In some cases, the observed conductance of an ensemble junction varies by orders of magnitude when the only known structural change is the thickness or identity of the molecular layer.…”
Section: Where Are We Now?mentioning
confidence: 96%
“…Spectroscopic methods such as X-ray spectroscopy [16] and vibrational spectroscopy [17,18] have been applied in the 1960s to characterize surface reactions. In particular, IR and Raman spectroscopies have been used for in situ analyses although the large dielectric constants of the aqueous solvents limit the use of IR spectroscopy.…”
Section: Introductionmentioning
confidence: 99%
“…(2) Similarly to [5], the increased concentration of oxygen at the Au/ H 2 Pc interface relative to the film bulk was found ( Fig. 4) (abrupt rise of the oxygen signal at the right interface 'H 2 Pc/substrate' is because the substrate material is oxide).…”
Section: Depth Profiling: Differences In Two Interfacesmentioning
confidence: 62%
“…Recently, secondary ion mass spectrometry (SIMS) with depth profiling was shown to be successful for analysis of inner interfaces in hybrid and organic (hetero-)structures with high resolution [4][5][6][7]. In comparison with profiling tool in X-ray photoelectron spectroscopy, which is also frequently used for destructive analysis of interfaces, SIMS profiling can more adequately be adjusted for concrete organic material.…”
Section: Introductionmentioning
confidence: 99%