2016 IEEE 29th International Conference on Micro Electro Mechanical Systems (MEMS) 2016
DOI: 10.1109/memsys.2016.7421712
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1.02 GHz cross-sectional Lamé mode resonator with high KT2 exceeding 4.6%

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Cited by 7 publications
(6 citation statements)
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“…To apply this formula for LFE CLMR, Equation ( 7 ) was re-evaluated. Specifically, term was substituted with the linear frequency adopted from [ 32 ] for degenerate CLMR modes while + expression was almost unaltered from the one in [ 31 ] with the exception of substituting the coefficient with as the CLMR mode was two-dimensional where n denotes the number of metal electrode pairs and , and are the equivalent layer stack thickness, density and Young’s modulus, respectively. The thermal resistance, , of the narrowly anchored resonator in [ 31 ] is expressed as where , and are the length, width and total thickness of the layers comprising anchors and is the material stack conductivity.…”
Section: Super High Frequency Alscn Clmrsmentioning
confidence: 99%
“…To apply this formula for LFE CLMR, Equation ( 7 ) was re-evaluated. Specifically, term was substituted with the linear frequency adopted from [ 32 ] for degenerate CLMR modes while + expression was almost unaltered from the one in [ 31 ] with the exception of substituting the coefficient with as the CLMR mode was two-dimensional where n denotes the number of metal electrode pairs and , and are the equivalent layer stack thickness, density and Young’s modulus, respectively. The thermal resistance, , of the narrowly anchored resonator in [ 31 ] is expressed as where , and are the length, width and total thickness of the layers comprising anchors and is the material stack conductivity.…”
Section: Super High Frequency Alscn Clmrsmentioning
confidence: 99%
“…However, the frequency of BAW resonators relies on the physical thickness of the stack, and the modulation of frequency requires either a wafer trimming process or additional loading layers, which hinders the integration of multiple filters with various filtering bands on a single chip. Research efforts have been focused on designing resonators with lithographic frequency tunability to overcome this limitation. For example, we reported an Al 0.92 Sc 0.08 N-based (1 μm thickness) modified LCAT mode resonator with tunable frequency by lithographically controlling the electrode pitch, as shown in Figure Figure a,b shows the schematic of the modified device structure and the corresponding scanning electron microscopy (SEM) image of the fabricated resonator, in which the bottom electrode is electrically floating.…”
Section: Alscn-based Applicationsmentioning
confidence: 99%
“…Similarly to CMRs, CLMRs can be excited through either a Lateral-Field-Excitation (LFE) [7] or a thickness-field-excitation (TFE) approach [6]. LFE CLMRs are formed by one set of IDT patterned on either the top or the bottom surface of an AlN layer.…”
Section: Figure 1: Schematic-view Of a 3-finger Clmr The Device Is Formed By Two Idts Sandwiching An Aln Film The Pitch Of The Idts (W) Imentioning
confidence: 99%
“…More recently, AlN cross-sectional Lamé-mode resonators were demonstrated (CLMRs) [5], [6]. CLMRs are piezoelectric resonators formed by two metallic IDTs sandwiching an AlN plate.…”
Section: Introductionmentioning
confidence: 99%