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This work presents the result of structure investigations of V2O5nanorods grown from thin films and powders prepared by sol-gel method. To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100°C to 600°C. The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), and mass spectroscopy (MS). The rod-like structure of V2O5was obtained at 600°C on both quartz glass and silicon substrates and also from the bulk xerogel. The growth process and the effect of annealing treatment on the nanostructure are briefly discussed.

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