We propose an efficient surrogate modeling technique for uncertainty quantification. The method is based on a wellknown dimension-adaptive collocation scheme. We improve the scheme by enhancing sparse polynomial surrogates with conformal maps and adjoint error correction. The methodology is applied to Maxwell's source problem with random input data. This setting comprises many applications of current interest from computational nanoplasmonics, such as grating couplers or optical waveguides. Using a nontrivial benchmark model, we show the benefits and drawbacks of using enhanced surrogate models through various numerical studies. The proposed strategy allows us to conduct a thorough uncertainty analysis, taking into account a moderately large number of random parameters.

The design of intrinsically flat two-dimensional optical components, i.e., metasurfaces, generally requires an extensive parameter search to target the appropriate scattering properties of their constituting building blocks. Such design methodologies neglect important near-field interaction effects, playing an essential role in limiting the device performance. Optimization of transmission, phase-addressing and broadband performances of metasurfaces require new numerical tools. Additionally, uncertainties and systematic fabrication errors should be analysed. These estimations, of critical importance in the case of large production of metaoptics components, are useful to further project their deployment in industrial applications. Here, we report on a computational methodology to optimize metasurface designs. We complement this computational methodology by quantifying the impact of fabrication uncertainties on the experimentally characterized components. This analysis provides general perspectives on the overall metaoptics performances, giving an idea of the expected average behavior of a large number of devices.

In this paper we present an algorithm for yield estimation and optimization consisting of Hessian-based optimization methods, an adaptive Monte Carlo (MC) strategy, polynomial surrogates, and several error indicators. Yield estimation is used to quantify the impact of uncertainty in a manufacturing process. Since computational efficiency is one main issue in uncertainty quantification, we propose a hybrid method, where a large part of a MC sample is evaluated with a surrogate model, and only a small subset of the sample is reevaluated with a high-fidelity finite element model. In order to determine this critical fraction of the sample, an adjoint error indicator is used for both the surrogate error and the finite element error. For yield optimization we propose an adaptive Newton-MC method. We reduce computational effort and control the MC error by adaptively increasing the sample size. The proposed method minimizes the impact of uncertainty by optimizing the yield. It allows one to control the finite element error, surrogate error, and MC error. At the same time it is much more efficient than standard MC approaches combined with standard Newton algorithms.

The electromagnetic field distribution as well as the resonating frequency of various modes in superconducting cavities used in particle accelerators for example are sensitive to small geometry deformations. The occurring variations are motivated by measurements of an available set of resonators from which we propose to extract a small number of relevant and independent deformations by using a truncated Karhunen-Loève expansion. The random deformations are used in an expressive uncertainty quantification workflow to determine the sensitivity of the eigenmodes. For the propagation of uncertainty, a stochastic collocation method based on sparse grids is employed. It requires the repeated solution of Maxwell's eigenvalue problem at predefined collocation points, i.e., for cavities with perturbed geometry. The main contribution of the paper is ensuring the consistency of the solution, i.e., matching the eigenpairs, among the various eigenvalue problems at the stochastic collocation points. To this end, a classical eigenvalue tracking technique is proposed that is based on homotopies between collocation points and a Newton-based eigenvalue solver. The approach can be efficiently parallelized while tracking the eigenpairs. In this paper, we propose the application of isogeometric analysis since it allows for the exact description of the geometrical domains with respect to common computer-aided design kernels, for a straightforward and convenient way of handling geometrical variations and smooth solutions.