Control of the carrier type in 2D materials is critical for realizing complementary logic computation. Carrier type control in WSe2 field‐effect transistors (FETs) is presented via thickness engineering and solid‐state oxide doping, which are compatible with state‐of‐the‐art integrated circuit (IC) processing. It is found that the carrier type of WSe2 FETs evolves with its thickness, namely, p‐type (<4 nm), ambipolar (≈6 nm), and n‐type (>15 nm). This layer‐dependent carrier type can be understood as a result of drastic change of the band edge of WSe2 as a function of the thickness and their band offsets to the metal contacts. The strong carrier type tuning by solid‐state oxide doping is also demonstrated, in which ambipolar characteristics of WSe2 FETs are converted into pure p‐type, and the field‐effect hole mobility is enhanced by two orders of magnitude. The studies not only provide IC‐compatible processing method to control the carrier type in 2D semiconductor, but also enable to build functional devices, such as, a tunable diode formed with an asymmetrical‐thick WSe2 flake for fast photodetectors.

Self-driven photodetectors that can detect light without any external voltage bias are important for low-power applications, including future internet of things, wearable electronics, and flexible electronics. While two-dimensional (2D) materials exhibit good optoelectronic properties, the extraordinary properties have not been fully exploited to realize high-performance self-driven photodetectors. In this paper, a metal–semiconductor–metal (MSM) photodetector with graphene and Au as the two contacts have been proposed to realize the self-driven photodetector. Van der Waals contacts are formed by dry-transfer methods, which is important in constructing the asymmetrical MSM photodetector to avoid the Fermi-level pinning effect. By choosing graphene and Au as the two contact electrodes, a pronounced photovoltaic effect is obtained. Without any external bias, the self-driven photodetector exhibits a high responsivity of 7.55 A W−1 and an ultrahigh photocurrent-to-dark current ratio of ~108. The photodetector also shows gate-tunable characteristics due to the field-induced Fermi-level shift in the constituent 2D materials. What is more, the high linearity of the photodetector over almost 60 dB suggests the easy integration with processing circuits for practical applications.

No abstract