The practical realization of nanoscale electronics faces two major challenges: the precise engineering of the building blocks and their assembly into functional circuits. In spite of the exceptional electronic properties of carbon nanotubes, only basic demonstration devices have been realized that require time-consuming processes. This is mainly due to a lack of selective growth and reliable assembly processes for nanotubes. However, graphene offers an attractive alternative. Here we report the patterning of graphene nanoribbons and bent junctions with nanometre-precision, well-defined widths and predetermined crystallographic orientations, allowing us to fully engineer their electronic structure using scanning tunnelling microscope lithography. The atomic structure and electronic properties of the ribbons have been investigated by scanning tunnelling microscopy and tunnelling spectroscopy measurements. Opening of confinement gaps up to 0.5 eV, enabling room-temperature operation of graphene nanoribbon-based devices, is reported. This method avoids the difficulties of assembling nanoscale components and may prove useful in the realization of complete integrated circuits, operating as room-temperature ballistic electronic devices.

Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon oxide surfaces. It is a convenient tool to quickly determine the thickness of individual FLG films. However, reports from literature show a large variation of the measured thickness of graphene layers. This paper is focused on the imaging mechanism of tapping mode AFM (TAFM) when measuring graphene and FLG thickness and we show that at certain measurement parameters significant deviations can be introduced in the measured thickness of FLG flakes. An increase of as much as 1 nm can be observed in the measured height of FLG crystallites, when using an improperly chosen range of free amplitude values of the tapping cantilever. We present comparative Raman spectroscopy and TAFM measurements on selected single and multilayer graphene films, based on which we suggest ways to correctly measure graphene and FLG thickness using TAFM. * Corresponding author. Fax: +36-1-3922226 email address: nemes@mfa.kfki.hu, URL: www.nanotechnology.hu (Peter Nemes-Incze)

Understanding how the mechanical behavior of materials deviates at the nanoscale from the macroscopically established concepts is a key challenge of particular importance for graphene, given the complex interplay between its nanoscale morphology and electronic properties 1,2,3,4,5 . In this work, the (sub-) nanometer wavelength periodic rippling of suspended graphene nanomembranes has been realized by thermal strain-engineering and investigated using Scanning Tunneling Microscopy. This allows us to explore the rippling of a crystalline membrane with wavelengths comparable to its lattice constant. The observed nanorippling mode violates the predictions of the continuum model 6 , and evidences the breakdown of the plate idealization 7 of the graphene monolayer. Nevertheless, microscopic simulations based on a quantum mechanical description of the chemical binding accurately describe the observed rippling mode and elucidate the origin of the continuum model breakdown. Spatially resolved tunneling spectroscopy measurements indicate a substantial influence of the nanoripples on the local electronic structure of graphene and reveal the formation of onedimensional electronic superlattices.