The electron-nucleus interaction in a super-intense few-cycle x-ray pulse is investigated. The super-intense few-cycle x-ray pulse-induced internal conversion (IC) process is discussed in detail. The x-ray laser-pulse induced IC coefficient is calculated, and in particular, it is derived in the case of a pulse of Gaussian shape and for a bound-free electron transition. The IC coefficient of the IC process induced by a super-intense few-cycle soft-x-ray laser pulse in the case of the 99m Tc isomer is determined numerically. The results obtained for the IC coefficient show significant carrier angular frequency, carrier-envelope phase, and pulse-length dependencies. The infinite pulse-length limit and experimental aspects are also discussed.
a b s t r a c tThe relationship between the structure, elemental composition, mechanical and tribological properties of TiC/amorphous carbon (TiC/a:C) nanocomposite thin films was investigated. TiC/a:C thin film of different compositions were sputtered by DC magnetron sputtering at room temperature. In order to prepare the thin films with various morphology only the sputtering power of Ti source was modified besides constant power of C source. The elemental composition of the deposited films and structural investigations confirmed the inverse changes of the a:C and titanium carbide (TiC) phases. The thickness of the amorphous carbon matrix decreased from 10 nm to 1-2 nm simultaneously with the increasing Ti content from 6 at% to 47 at%. The highest hardness (H) of $ 26 GPa and modulus of elasticity (E) of $ 220 GPa with friction coefficient of 0.268 was observed in case of the film prepared at $ 38 at% Ti content which consisted of 4-10 nm width TiC columns separated by 2-3 nm thin a:C layers. The H3/E2 ratio was $ 0.4 GPa that predicts high resistance to plastic deformation of the TiC based nanocomposites beside excellent wear-resistant properties (H/E ¼0.12).
A new approach to the measurement of the local thickness and characterization of grain boundaries is presented. The method is embodied in a software tool that helps finding and setting sample orientations useful for high resolution transmission electron microscopy examination of grain boundaries in polycrystalline thin films.The novelty is the simultaneous treatment of the two neighboring grains and orienting both grains and the boundary plane simultaneously. The same metric matrix based formalism is used for all crystal systems. Input to the software tool includes orientation data for the grains in question, which is determined automatically for a large number of grains by the commercial ASTAR program. Our software also helps identifying grains in a noisy orientation map. The grain boundaries suitable for HRTEM examination are automatically identified by our software tool. Individual boundaries are selected manually for detailed HRTEM examination from the automatically identified set. Goniometer settings needed to observe the selected boundary in HRTEM are advised by the software. Operation is demonstrated on examples from the cubic and hexagonal crystal systems.
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