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Electron paramagnetic resonance studies have been carried out over 3.7‐300 K on micropowders of Ni1‐xZnxFe2O4 ferrites, obtained by high temperature synthesis and preliminary characterized by X‐ray diffraction and differential scanning calorimetry in a wide range of tempera‐tures. Complimentary, scanning probe microscopy, compris‐ing atomic and magnetic force microscopies has been applied to polycrystalline Ni1‐xZnxFe2O4thin films. The correlation between X‐ray and differential scanning calorimetry data has been observed. Deconvolution of the obtained paramagnetic resonance spectra into Gaussian components and their further analysis have allowed retrival of the compensation points of the magnetc momenta of the sublattices of Ni1‐xZnxFe2O4, as well as of superparamagnetism effect and g‐factors dispersion verified by studies on polycrystalline thin films. (© 2015 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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Optical constants of CdS:O window layers for solar cells were studied as a function of the oxygen content. The CdS:O thin films were deposited on glass substrates in the presence of oxygen at 0, 2, 3 and 5% values of O/Ar ratio by rf magnetron sputtering. Ellipsometric measurements on CdS:O thin films were carried out over 0.75–6.0 eV photon energies at room temperature. Optical constants were determined by using a the best‐fit dispersion model. Broadening of spectral features of the obtained optical constants is found to increase with increasing O/Ar ratio. Besides, the CdS:O films grown at 100 °C as compared to those grown at 200 °C exhibit increased spectral broadening. In fact, almost complete smearing of band gap spectral feature is observed for CdS:O films deposited at 5% value of O/Ar ratio, resulting in appreciable transparency of the films in a spectral range above the energy gap of CdS. This, in turn, leads to an increased carrier collection in the UV spectral range and allows to considering CdS:O film as a candidate for improved window‐layer material for solar cell application. (© 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

This work reports the results of spectroscopic ellipsometry study of CdS thin films, deposited on glass substrates in the presence of oxygen at room temperature by rf sputtering. The data acquisition, together with the subsequent linear regression analysis to restore dielectric function has been performed over the photon energy range 1.5–5.0 eV. The obtained oxygen-free CdS films and reference bulk CdS have been found to be very much the same regarding their dielectric function spectra. On the other hand, blue-shift of the main structures in dielectric function has been observed for CdS:O films deposited at 5% value of O/Ar ratio. In spite of the broadening taking place on a par with the shift, the last turns out to be so large that provides transparency of CdS:O thin films in a spectral range above the energy gap of CdS. The obtained results allow to considering CdS:O as an improved window-layer material for solar cell application.