We report on the optical properties and local bonding configurations of both as-deposited and postannealed hydrogenated amorphous silicon nitride ͑a-SiN x :H͒ thin films grown on crystalline Si substrates with x approximately 1.2± 0.1. Ultraviolet optical reflection and infrared ͑IR͒ absorption measurements were applied to characterize the films. A method simply based on optical reflection spectra is proposed for accurate determination of the optical band gap, band tail, wavelength-dependent refractive index and extinction coefficient, as well as the film thickness, suggesting that the Tauc-Lorentz ͓G. E. Jellison, Jr. and F. A. Modine, Appl. Phys. Lett. 69, 371 ͑1996͒; 69, 2137 ͑1996͔͒ model with the inclusion of Urbach tail is the optimal one to describe the optical response of a-SiN x : H films. The yielded optical parameters can be related well to the film microstructure as revealed by the IR absorption analysis. These results have implications for future deposition controlling and device applications.
Sibling history of diabetes was more strongly associated with diabetes risk than parental history among high-risk subjects. Subjects with a sibling or maternal history of diabetes had significantly lower insulin secretion. Sibling history is an important and independent risk factor for diabetes even among multi-risk populations. Those with a sibling history of diabetes warrant intensive care and follow-up screening.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.