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Single and dual-beam irradiations of oxide (c-ZrO2, MgO, Gd2Ti2O7) and carbide (SiC) single crystals were performed to study combined effects of nuclear (S-n) and electronic (S-e) energy losses. Rutherford backscattering experiments in channeling conditions show that the S-n/S-e cooperation induces a strong decrease of the irradiation-induced damage in SiC and MgO and almost no effects in c-ZrO2 and Gd2Ti2O7. The healing process is ascribed to electronic excitations arising from the electronic energy loss of swift ions. These results present a strong interest for both fundamental understanding of the ion-solid interactions and technological applications in the nuclear industry where expected cooperative S-n/S-e effects may lead to the preservation of the integrity of nuclear devices. (C) 2013 AIP Publishing LLC

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Rutherford backscattering spectrometry in a channeling direction (RBS/C) is a powerful tool for analysis of the fraction of atoms displaced from their lattice positions. However, it is in many cases not straightforward to analyze what is the actual defect structure underlying the RBS/C signal. To reveal insights of RBS/C signals from arbitrarily complex defective atomic structures, we develop here a method for simulating the RBS/C spectrum from a set of arbitrary read-in atom coordinates (obtained, e.g., from molecular dynamics simulations). We apply the developed method to simulate the RBS/C signals from Ni crystal structures containing randomly displaced atoms, Frenkel point defects, and extended defects, respectively. The RBS/C simulations show that, even for the same number of atoms in defects, the RBS/C signal is much stronger for the extended defects. Comparison with experimental results shows that the disorder profile obtained from RBS/C signals in ion-irradiated Ni is due to a small fraction of extended defects rather than a large number of individual random atoms.