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A task group of the JCPDS-International Center for Diffraction Data (ICDD) was established with the charge of investigating the use of silver behenate, CH 3 (CH 2 ) 2 oCOO-Ag, as a possible low-angle calibration standard for powder diffraction applications. Utilizing several data collection and analysis techniques, long-period spacing (JQOI) values with a range of 58.219-58.480 A were obtained. Using the same collected data and one data analysis refinement calculation method resulted in d m values with a range of 58.303-58.425 A. Data collected using a silicon internal standard and the same singular data analysis calculation method provided d^ values with a range of 58.363-58.381 A.

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