Articles you may be interested inInvestigation of electronic trap states in organic photovoltaic materials by current-based deep level transient spectroscopy Appl. Phys. Lett. 100, 263304 (2012); 10.1063/1.4731637 New model for the characterization of bulk traps by current deep level transient spectroscopy in metal oxidesemiconductor transistors
The utility of isothermal current deep level transient spectroscopy (DLTS) techniques in directly probing solar cells is described and illustrated. A modified approach to processing the isothermal DLTS data is also presented. Specifically, it is pointed out that properly normalized isothermal data, whether derived from a current or capacitance transient, should conform to a single, temperature-independent curve.
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