We investigated a hematite α-Fe2O3/permalloy Ni80Fe20 bilayer film where the antiferromagnetic layer consisted of small hematite grains in the 2 to 16 nm range. A pronounced exchange bias effect occurred below the blocking temperature of 40 K. The magnitude of exchange bias was enhanced relative to reports for identical compounds in large grain, epitaxial films. However, the blocking temperature was dramatically reduced. As the Néel temperature of bulk α-Fe2O3 is known to be very high (860 K), we attribute the lowtemperature onset of exchange bias to the well-known finite-size effect which suppresses the Morin transition for nanostructured hematite. Polarized neutron reflectometry was used to place an upper limit on the concentration and length scale of a layer of uncompensated moments at the antiferromagnetic interface. The data were found to be consistent with an induced magnetic region at the antiferromagnetic interface of 0.5-1.0 μB per Fe atom within a depth of 1-2 nm. The field dependence of the neutron spin-flip signal and spin asymmetry was analyzed in the biased state, and the first and second magnetic reversal were found to occur by asymmetric mechanisms. For the fully trained permalloy loop, reversal occurred symmetrically at both coercive fields by an in-plane spin rotation of ferromagnetic domains. We investigated a hematite α-Fe 2 O 3 /permalloy Ni 80 Fe 20 bilayer film where the antiferromagnetic layer consisted of small hematite grains in the 2 to 16 nm range. A pronounced exchange bias effect occurred below the blocking temperature of 40 K. The magnitude of exchange bias was enhanced relative to reports for identical compounds in large grain, epitaxial films. However, the blocking temperature was dramatically reduced. As the Néel temperature of bulk α-Fe 2 O 3 is known to be very high (860 K), we attribute the low-temperature onset of exchange bias to the well-known finite-size effect which suppresses the Morin transition for nanostructured hematite. Polarized neutron reflectometry was used to place an upper limit on the concentration and length scale of a layer of uncompensated moments at the antiferromagnetic interface. The data were found to be consistent with an induced magnetic region at the antiferromagnetic interface of 0.5-1.0 μ B per Fe atom within a depth of 1-2 nm. The field dependence of the neutron spin-flip signal and spin asymmetry was analyzed in the biased state, and the first and second magnetic reversal were found to occur by asymmetric mechanisms. For the fully trained permalloy loop, reversal occurred symmetrically at both coercive fields by an in-plane spin rotation of ferromagnetic domains.

By ascertaining NiO surface roughness in a Ni80Fe20/NiO film system, we were able to correlate the effects of altered interface roughness from low-energy ion-beam bombardment of the NiO layer and the different thermal instabilities in the NiO nanocrystallites. From experiment and by modelling the temperature dependence of the exchange bias field and coercivity, we have found that reducing the interface roughness and changing the interface texture from an irregular to striped conformation enhanced the exchange coupling strength. Our results were in good agreement with recent simulations using the domain state model that incorporated interface mixing. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3697405

The Ti-Zr-V non-evaporable getter (NEG) films were grown on Aluminum (Al) alloy and CuCrZr alloy, which can be used to fabricate the vacuum chambers in the ultra-high vacuum status. The Al alloy and CuCrZr alloy samples with different surface roughness were prepared by the different manufacturing methods. We studied whether the behavior and the microstructure of the Ti-Zr-V getter films are influence by the surface roughness of the substrate. The surface morphologies of Ti-Zr-V NEG films appear distinct and the growth of the films follows the nature of the substrate surface. The Ti-Zr-V films have nanocrystalline structures and the grain sizes of the films become slightly larger with increasing the surface smoothness. In addition, it was found that the reduction of the Ti-Zr-V NEG films to the metallic state was affected by presence of surface defects on the films. The surface defects should result from the existence of micro-pores, pockmarks, and micro-cracks on the original substrate, which produced from the manufacturing process.

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