In this paper we derive explicit formulas for disarrangement densities of submacroscopic separations, switches, and interpenetrations in the context of firstorder structured deformations. Our derivation employs relaxation within one mathematical setting for structured deformations of a specific, purely interfacial density, and the formula we obtain agrees with one obtained earlier in a different setting for structured deformations. Coincidentally, our derivation provides an alternative method for obtaining the earlier result, and we establish new explicit formulas for other measures of disarrangements that are significant in applications.
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