2014
Enhanced Vertical Charge Transport in a Semiconducting P3HT Thin Film on Single Layer Graphene
Abstract: The crystallization and electrical characterization of the semiconducting polymer poly(3‐hexylthiophene) (P3HT) on a single layer graphene sheet is reported. Grazing incidence X‐ray diffraction revealed that P3HT crystallizes with a mixture of face‐on and edge‐on lamellar orientations on graphene compared to mainly edge‐on on a silicon substrate. Moreover, whereas ultrathin (10 nm) P3HT films form well oriented face‐on and edge‐on lamellae, thicker (50 nm) films form a mosaic of lamellae oriented at different …
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“…Figure e demonstrates that the (020) reflection around q z = 16.7 nm –1 pointing along the b crystal axis lies normal to the graphene surface and confirms the existence of the face-on oriented crystals as well. Thus, the results in Figure c,e are in line with the previous studies on P3HT thin-film crystal orientation on graphene reported by Skrypnychuk et al − By contrast, the grazing-incidence WAXS pattern of P3BrHT with a thickness of 21 nm on graphene in Figure d shows the most intense (200) reflection of the triclinic P3BrHT crystal lattice located only parallel to the sample surface . An additional measurement (see Figure S1 in the Supporting Information) at an incident angle of 4.5°, which is close to Bragg’s condition for the (200) reflection, indicates no (200) reflection on the meridian and along with the results in Figure f proves the complete face-on crystal orientation in this sample.…”
Section: Results
supporting
confidence: 90%