2011
DOI: 10.1080/09500340.2011.633763
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Zernike polynomials: a guide

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Cited by 72 publications
(63 citation statements)
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“…This technique is similar to the microspot LEED technique discussed in [20] but can also be used in PEEM mode. The Zernike polynomials ( , ) are a commonly used basis for the fitting of optical aberrations and the Zernike coefficients provide quantitative information about the low order geometric aberrations of the tested optics [21,22]. In case of PEEM-3, a 10-μm-size back focal plane aperture was scanned across the electron beam, allowing a narrow ray of electrons to pass to the detector.…”
Section: Hartmann Measurement Of Aberration Coefficientsmentioning
confidence: 99%
“…This technique is similar to the microspot LEED technique discussed in [20] but can also be used in PEEM mode. The Zernike polynomials ( , ) are a commonly used basis for the fitting of optical aberrations and the Zernike coefficients provide quantitative information about the low order geometric aberrations of the tested optics [21,22]. In case of PEEM-3, a 10-μm-size back focal plane aperture was scanned across the electron beam, allowing a narrow ray of electrons to pass to the detector.…”
Section: Hartmann Measurement Of Aberration Coefficientsmentioning
confidence: 99%
“…The Zernike circle polynomials are an orthonormal basis set of functions whose general form in polar coordinates r r; θ is given by [17][18][19][20][21] Z n;m r N n;m R n;m rA m θ;…”
Section: B Zernike Polynomial Basismentioning
confidence: 99%
“…Figure 2 shows the shapes of several Zernike modes of different radial and angular orders. Surface plots for other modes can be found in [19].…”
Section: B Zernike Polynomial Basismentioning
confidence: 99%
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“…Wavefront engineering -Genetic algorithm optimization enables the engineering of the wavefront to target a given Zernike polynomial 45,46 . Zernike polynomials > • , where stands for the radial degree and the azimuthal degree, are a set of orthonormal functions which are widely used in controlling and characterising the aberrations of optical systems.…”
mentioning
confidence: 99%