DOI: 10.1109/date.2004.1268829
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Abstract: AbstractWe define the concepts of z -sets and z -detections for combinational circuits (or the combinational logic of scan circuits). Based on these concepts we define structural characteristics and characteristics based on fault simulation. We show that these characteristics determine the numbers of fault pairs that are guaranteed to be distinguished by a given fault detection test set. These fault pairs do not need to be considered during diagnostic fault simulation or test generation. We demonstrate that b…

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