2022
DOI: 10.1016/j.radphyschem.2022.110157
|View full text |Cite
|
Sign up to set email alerts
|

X-ray fluorescence analysis of solid-state films, layers, and coatings

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 9 publications
(5 citation statements)
references
References 123 publications
0
4
0
Order By: Relevance
“…A review by Revenko et al 58 discussed comprehensively the characterisation of thin films and surface coatings by XRF and TXRF spectrometries using mainly scattered radiation. The review included a discussion of a round-robin on the determination of the thickness of a multi-layer Au/Ni/Cu sample for which the SD of the reported thickness was 4.3–6.6%.…”
Section: Grazing X-ray Techniques Including Txrf Spectrometrymentioning
confidence: 99%
“…A review by Revenko et al 58 discussed comprehensively the characterisation of thin films and surface coatings by XRF and TXRF spectrometries using mainly scattered radiation. The review included a discussion of a round-robin on the determination of the thickness of a multi-layer Au/Ni/Cu sample for which the SD of the reported thickness was 4.3–6.6%.…”
Section: Grazing X-ray Techniques Including Txrf Spectrometrymentioning
confidence: 99%
“…Revenko et al reviewed, with the aid of 189 references, XRF analysis of solid state films, layers and coatings . 205 As well as the composition of such materials, the review also discussed the ability of the technique to determine the thickness of the layers. The review was conveniently split into sections, including: the determination of surface film densities, the use of coupling equations and theoretical ways of accounting for matrix effects, determination of the chemical composition and coating thicknesses of samples with irregular surface shape.…”
Section: Inorganic Chemicals and Materialsmentioning
confidence: 99%
“…Revenko et al reviewed, with the aid of 189 references, XRF analysis of solid state lms, layers and coatings 205. As well as the composition of such materials, the review also discussed the ability of the technique to determine the thickness of the layers.…”
mentioning
confidence: 99%
“…The latter is based on an iterative algorithm using atomic parameters, such as, for example, the probability, given a certain energy of the excitation photon, of producing a certain fluorescence line. These techniques are very fast but do not work very well on complex samples like ancient bronzes, which are generally representable as a structure with irregular multiple layers, where the innermost layer is the actual alloy, covered by one or more layers of corrosion and possibly a protective layer, although algorithms capable of dealing with multilayers have been developed [11,12]. Furthermore, these algorithms require the extraction of the areas occupied by the peaks by removing the background and performing deconvolution operations to separate any overlapping peaks.…”
Section: Introductionmentioning
confidence: 99%