Flag leaf plays an important role in photosynthetic capacity and yield potential in wheat. In this study, we used a recombinant inbred line (RIL) population containing 188 lines derived from a cross between Lankao86 (LK86) and Ermangmai (EMM) to construct a genetic map using the Wheat 660K single nucleotide polymorphism (SNP) array. The high-density genetic map contains 122,620 SNP markers spanning 5,185.06 cM. It shows good collinearity with the physical map of Chinese Spring, and anchors multiple sequences of previously unplaced scaffolds (ChrUn) onto chromosomes. Based on the highdensity genetic map, we identi ed seven and twelve quantitative trait loci (QTL) for ag leaf length (FLL) and width (FLW) across eight environments, respectively. Among them, three QTL for FLL and one for FLW are major and stably express in more than ve environments. The physical distance between the anking markers for QFll.igdb-3B is only 444 kb containing eight high con dence genes. These results suggested that we could directly map the candidate genes in a relatively small region by the high-density genetic map constructed with the Wheat 660K array. Furthermore, the identi cation of environmentally stable QTL for ag leaf morphology laid a foundation for the following gene cloning and ag leaf morphology improvement.
Key MessagesA high-density genetic map containing122,620 SNP markers was constructed, which facilitated the identi cation of four major ag leaf related QTL in relatively narrow intervals.