Visibility of Single Atoms

Crewe, A. V.; Wall, Joseph S.; Langmore, John P.

doi:10.1126/science.168.3937.1338

Cited by 714 publications

(373 citation statements)

References 4 publications

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“…The results show that the proposed double-gate field emission cathodes are promising for high current and high brightness electron beam applications such as free-electron lasers and THz power devices. The extremely high brightness of field emission electron beams has enabled the realization of electron microscopes with single-atom resolution 1 and has stimulated high current and high current density applications such as free-electron lasers 2,3 and THz vacuum electronic devices. [4][5][6][7] Field emitters can produce high brightness electron beams via quantum tunneling by applying a strong electric field in the order of GV/m to solid surfaces.…”

mentioning

confidence: 99%

Electron beam collimation with a 40 000 tip metallic double-gate field emitter array and in-situ control of nanotip sharpness distribution

Helfenstein

Guzenko

Fink

et al. 2013

Journal of Applied Physics

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Electron beam collimation with a 40 000 tip metallic double-gate field emitter array and in-situ control of nanotip sharpness distributionHelfenstein, P; Guzenko, V A; Fink, H W; Tsujino, S Abstract: The generation of highly collimated electron beams from a double-gate field emitter array with 40000 metallic tips and large collimation gate apertures is reported. Field emission beam measurements demonstrated the reduction of the beam envelope down to the array size by applying a negative potential to the on-chip gate electrode for the collimation of individual field emission beamlets. Owing to the optimized gate structure, the concomitant decrease of the emission current was minimal, leading to a net enhancement of the current density. Furthermore, a noble gas conditioning process was successfully applied to the double-gate device to improve the beam uniformity in-situ with orders of magnitude increase of the active emission area. The results show that the proposed double-gate field emission cathodes are promising for high current and high brightness electron beam applications such as free-electron lasers and THz power devices.

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mentioning

confidence: 99%

Electron beam collimation with a 40 000 tip metallic double-gate field emitter array and in-situ control of nanotip sharpness distribution

Helfenstein

Guzenko

Fink

et al. 2013

Journal of Applied Physics

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“…Transmission electron microscopy (TEM) and scanning TEM (STEM) have been used nearly since their inception for NP characterization but have been limited by the available resolution and precision [7][8][9][10] . Aberration correction has made sub-Angstrom spatial resolution routine in TEM and STEM.…”

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confidence: 99%

Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts

et al. 2014

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Measuring picometre-scale shifts in the positions of individual atoms in materials provides new insight into the structure of surfaces, defects and interfaces that influence a broad variety of materials' behaviour. Here we demonstrate sub-picometre precision measurements of atom positions in aberration-corrected Z-contrast scanning transmission electron microscopy images based on the non-rigid registration and averaging of an image series. Non-rigid registration achieves five to seven times better precision than previous methods. Non-rigidly registered images of a silica-supported platinum nanocatalyst show pm-scale contraction of atoms at a (1 11)/( 1 11) corner towards the particle centre and expansion of a flat (1 11) facet. Sub-picometre precision and standardless atom counting with o1 atom uncertainty in the same scanning transmission electron microscopy image provide new insight into the threedimensional atomic structure of catalyst nanoparticle surfaces, which contain the active sites controlling catalytic reactions.

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“…In this report, we describe the application of electron energy loss spectroscopy (EELS) (8)(9)(10) in the scanning transmission electron microscope (STEM) (11)(12)(13) to determine the mass and phosphorus distributions along individual NFs from squid giant axons. STEM͞EELS has recently gained attention as a near-atomic-resolution structural and nanoanalytical tool for studying materials (14)(15)(16), but its application to biological molecules has been largely precluded by the difficulty of extracting information from very weak signals.…”

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confidence: 99%

Phosphorylation and subunit organization of axonal neurofilaments determined by scanning transmission electron microscopy

Leapman

Gallant

Reese

et al. 1997

Proc. Natl. Acad. Sci. U.S.A.

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Phosphorylation plays a critical role in controlling the function of cytoskeletal assemblies but no direct method yet exists to measure the phosphorylation state of proteins at the level of individual molecules and assemblies. Herein, we apply scanning transmission electron microscopy in combination with electron energy loss spectroscopy to measure the distributions of mass and phosphorus in neurofilaments (NFs) isolated from the squid giant axon. We find that native squid NFs, in contrast to typical reconstituted intermediate filaments, are a relatively homogeneous population containing only eight coiled-coil dimers per cross section. The measured stoichiometry of ϳ1:1 for light͞heavy peptides strongly suggests that squid NFs are composed of heterodimers. Furthermore, each heavy chain of the dimers carries at least 100 phosphate groups and is, therefore, near-maximally phosphorylated. These results also demonstrate that scanning transmission electron microscopy combined with electron energy loss spectroscopy at the nanometer scale is capable of characterizing the level and distribution of phosphorylation in individual mass-mapped protein assemblies.

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Visibility of Single Atoms

Abstract: Theoretical and experimental studies indicate that, with a high-resolution scanning electron microscope, it is now possible to obtain pictures of a single heavy atom resting on a thin carbon substrate.

Cited by 714 publications

References 4 publications

Electron beam collimation with a 40 000 tip metallic double-gate field emitter array and in-situ control of nanotip sharpness distribution

Electron beam collimation with a 40 000 tip metallic double-gate field emitter array and in-situ control of nanotip sharpness distribution

Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts

Phosphorylation and subunit organization of axonal neurofilaments determined by scanning transmission electron microscopy

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