2018
DOI: 10.1038/s41598-018-19791-3
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Vertical Light Sheet Enhanced Side-View Imaging for AFM Cell Mechanics Studies

Abstract: The ability to measure dynamic structural changes within a cell under applied load is essential for developing more accurate models of cell mechanics and mechanotransduction. Atomic force microscopy is a powerful tool for evaluating cell mechanics, but the dominant applied forces and sample strains are in the vertical direction, perpendicular to the imaging plane of standard fluorescence imaging. Here we report on a combined sideways imaging and vertical light sheet illumination system integrated with AFM. Our… Show more

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Cited by 40 publications
(42 citation statements)
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“…Using a custom MATLAB code, force-indentation data were fit to the Hertzian contact mechanics model to determine elastic moduli (stiffness) for each cell (Beicker et al, 2018; Cribb et al, 2016). The force versus indentation data were fit up to indentations of 750nm which corresponded to less than 10% of the cell height.…”
Section: Methodsmentioning
confidence: 99%
“…Using a custom MATLAB code, force-indentation data were fit to the Hertzian contact mechanics model to determine elastic moduli (stiffness) for each cell (Beicker et al, 2018; Cribb et al, 2016). The force versus indentation data were fit up to indentations of 750nm which corresponded to less than 10% of the cell height.…”
Section: Methodsmentioning
confidence: 99%
“…Our combined atomic force microscope and side-view light sheet fluorescence microscope ( Figure 1A) allows visualization of the dynamics of cellular deformations in the plane of applied force while simultaneously monitoring the force response of the cell . We have previously used this tool to show the existence of separate elastic moduli correlated with whole-cell and nuclear deformations (Beicker et al 2018). We built on this previous work by studying the dynamics of nuclear morphology and the correlated force response under compression by AFM.…”
Section: Combined Afm and Side-view Light Sheet Microscopy Show Straimentioning
confidence: 99%
“…5). For both methods we introduced a small (180 µm) right-angle reflective prism (8531-607-1, Precision Optics) attached to a 6 degree-offreedom mount, and lowered the mirror adjacent to the cell of interest [25]. For HLS imaging, the LBS reflected off the mirror and illuminated a single x-y plane.…”
Section: Horizontal and Vertical Lsfm Of Highlights Organization Of Hmentioning
confidence: 99%
“…Transitioning from HLS to VLS is straightforward, fast, and can be done entirely through software. It is important to note that resolution is not affected when the imaging plane is rotated by the mirror [25]. Because of LSFM's ability to illuminate a single plane, we obtained images with low background and high signal-to-noise of orthogonal planes of the same nucleus.…”
Section: Horizontal and Vertical Lsfm Of Highlights Organization Of Hmentioning
confidence: 99%
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