Eyespot can reduce yields, even up to 50%. There are four genetically characterized resistances in wheat varieties, controlled by: (1) the Pch1 gene, transferred from Aegilops ventricosa; (2) the Pch2 gene, originating from wheat variety Capelle Desprez; (3) the Q.Pch.jic-5A genes was compared with resistance conferred by Pch1 or Q.Pch.jic-5A alone. We found significant differences between infection scores evaluated in resistant lines carrying Pch1 and Q.Pch.jic-5A alone, while no differences in terms of the level of resistance expression were detected between Pch1 alone and Pch1 + Q.Pch.jic-5A, and between wheat lines carrying Pch1 and Pch2 alone. Moreover, we demonstrated that the Pch1 gene, together with an Ae. ventricosa segment, caused statistically significant yield losses, both as a single eyespot resistance source or in a combination with Q.Pch.jic-5A. Yield scores showed that wheat lines with Q.Pch.jic-5A had the highest yields, similar to the yielding potential of Pch2-bearing lines and control varieties.