volume 60, issue 8, P3166-3173 1974
DOI: 10.1063/1.1681501
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Abstract: Articles you may be interested inQuantitative analysis of electron energy loss spectra and modelling of optical properties of multilayer systems for extreme ultraviolet radiation regime Improvement of imaging properties by optimizing the capping structure in extreme ultraviolet lithography Multiphoton ionization/dissociation of osmium tetroxide J. Chem. Phys. 98, 951 (1993); 10.1063/1.464258On the lowest excited singlet state of osmium tetroxideThe gas phase absorption spectra of the compounds OsO. and RuO. w…

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