2010
DOI: 10.2528/pier10060805
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Unique Permittivity Determination of Low-Loss Dielectric Materials From Transmission Measurements at Microwave Frequencies

Abstract: Abstract-A non-resonant microwave method has been proposed for accurate complex permittivity determination of low-loss materials. The method uses two measurement data of the magnitude of transmission properties of the sample. While the first datum must correspond to a frequency point resulting in a maximum magnitude of transmission properties, the other can be any datum at a frequency different than the first datum and not far distant from the first datum. Two closed-from expressions are derived for a good ini… Show more

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Cited by 43 publications
(55 citation statements)
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“…In the literature, various methods based on complex S 21 measurements have been proposed for stable ε r measurement of highloss and low-loss dielectric materials [30][31][32][33][34][35][36][37][38]. While the method in [30] assumes that the sample is low-loss and thin, the method in [31] uses a second-order approximation to derive a one-variable objective function for fast ε r measurements.…”
Section: Introductionmentioning
confidence: 99%
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“…In the literature, various methods based on complex S 21 measurements have been proposed for stable ε r measurement of highloss and low-loss dielectric materials [30][31][32][33][34][35][36][37][38]. While the method in [30] assumes that the sample is low-loss and thin, the method in [31] uses a second-order approximation to derive a one-variable objective function for fast ε r measurements.…”
Section: Introductionmentioning
confidence: 99%
“…Although the technique in [37] is attractive and applicable to low-loss samples, it is not appropriate for thin samples with lower dielectric constants. To eliminate this drawback, the method in our recently published paper [38] can be employed. However, the discussed methods in [34][35][36][37][38] need precise knowledge of the sample thickness.…”
Section: Introductionmentioning
confidence: 99%
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