“…Among diverse degradations, − metal electrode corrosion due to reactions with halide molecules has been widely observed and confirmed in different devices. − It can seriously impact the device decay and even dominate and determine the device lifetime, − under long-term operation. In the process, halide compounds, for instance, HI, NH 4 I, and so forth, as decomposition products of perovskites, can diffuse through the electron/hole-transporting layer (ETL/HTL) to reach the metal electrode and even reach the outer surface of the electrode via pinholes where they corrode the electrode by a redox reaction. ,, Different metal electrodes show very different stabilities in PSCs due to their distinct chemical properties, for instance, redox potential. ,,, Severe decomposition of perovskites is demonstrated when using Al, , Ag, ,, or Cu top electrodes , by exhaustion of iodine in the active layer due to the formation of metal iodide, for instance, AgI. Moreover, in our previous study, it is demonstrated that the electrochemical metallization effect contributes much to the degradation of metal-electrode devices as well under operation, in which electrode metals get ionized first by reaction with a halide.…”