UHV microscopy of surfaces

Ai, R.; Buckett, M.I.; Dunn, Derren; Savage, T. S.; Zhang, J.P.; Marks, Laurence D.

doi:10.1016/0304-3991(91)90219-v

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2009

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Cited by 9 publications

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“…Transmission electron microscopy was performed in the attached Hitachi UHV-H9000 operated at 300 keV; information on using transmission electron microscopy to study surfaces has been given elsewhere [35][36][37][38][39][40]. An in situ test for the presence of magnetism in the single crystal TEM specimens, as a way to empirically identify possible phases, was developed based on the attraction of unfixed specimens to the strong magnetic field of the objective lens of the microscope.…”

Section: Experimental Methodsmentioning

confidence: 99%