2013
DOI: 10.1063/1.4803018
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Two-dimensional weak anti-localization in Bi2Te3 thin film grown on Si(111)-(7 × 7) surface by molecular beam epitaxy

Abstract: We report on low temperature transport studies of Bi2Te3 topological insulator thin films grown on Si(111)-(7 × 7) surface by molecular beam epitaxy. A sharp increase in the magnetoresistance with magnetic field at low temperature indicates the existence of weak anti-localization. The measured weak anti-localization effect agrees well with the Hikami-Larkin-Nagaoka model, and the extracted phase coherence length shows a power-law dependence with temperature indicating the existence of a two-dimensional system.… Show more

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Cited by 82 publications
(101 citation statements)
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“…Ordinarily for disordered thin metals and other known TI surfaces 44,45 , the magnetic field range of interest for WAL or WL is 0.1 -1 T. Theoretically, this range can be estimated by the characteristic field B φ = (h/e)/8πl 2 φ without magnetic impurity scattering. Since even a small amount of magnetic impurities can lower the phase coherence length by orders of magnitude 46,47 , the characteristic field can be much larger than 1 T. In future studies, a wider range of magnetic field may need to be considered for WAL and WL.…”
Section: Nagoaka Formulationmentioning
confidence: 99%
“…Ordinarily for disordered thin metals and other known TI surfaces 44,45 , the magnetic field range of interest for WAL or WL is 0.1 -1 T. Theoretically, this range can be estimated by the characteristic field B φ = (h/e)/8πl 2 φ without magnetic impurity scattering. Since even a small amount of magnetic impurities can lower the phase coherence length by orders of magnitude 46,47 , the characteristic field can be much larger than 1 T. In future studies, a wider range of magnetic field may need to be considered for WAL and WL.…”
Section: Nagoaka Formulationmentioning
confidence: 99%
“…We here make a final remark on the measured pre-factor α. In most published results, [28][29][30] the pre-factor α = 0.5 instead of 1, which indicates one single channel despite two surfaces (top and bottom) existed in their samples. In order to observe two independent channels (α = 1), one must be able to decouple the contributions from the top and bottom surfaces.…”
Section: Electric Measurementmentioning
confidence: 99%
“…The UHV conditions of this system ensure that films are free from ex situ contamination. [18,23,24].…”
Section: Film Growth and Characterizationmentioning
confidence: 99%