Superlattices and Microstructures volume 44, issue 4-5, P633-640 2008 DOI: 10.1016/j.spmi.2008.01.020 View full text
Masashi Arita, Youhei Okubo, Kouichi Hamada, Yasuo Takahashi

Abstract: Conductance measurements of nanostructures with simultaneous transmission electron microscopy (TEM) were performed on thin insulating MgO films (2-3 nm thick) and MgO/Fe/MgO tri-layer films (2 nm/1 nm/2 nm) deposited on tip-shaped Au electrodes. A movable counter electrode was used to choose nanoscale regions with contact areas smaller than 10 nm 2 for investigation. Systematic measurements on MgO films taken by keeping contact with the counter electrode provided a tunnelling barrier height of about 1.4 eV. T…

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