1995
DOI: 10.1016/0921-4534(95)00213-8
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Transition from (110) to (103)/(013) growth in Y1Ba2Cu3O7−x thin films on (110) SrTiO3 substrates

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Cited by 39 publications
(32 citation statements)
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“…The films' surface is relatively smooth, having an average surface roughness of few tens of angstroms according to atomic force microscope measurements. We verified the in-plane orientation by comparing the normal state resistance along the two different directions and found the expected anisotropy [16].…”
mentioning
confidence: 76%
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“…The films' surface is relatively smooth, having an average surface roughness of few tens of angstroms according to atomic force microscope measurements. We verified the in-plane orientation by comparing the normal state resistance along the two different directions and found the expected anisotropy [16].…”
mentioning
confidence: 76%
“…A PrBa 2 Cu 3 O 7−x buffer layer was first deposited by offaxis RF sputtering in order to reduce the growth of (103) oriented grains [16]. The thickness of the samples is less than 500Å.…”
mentioning
confidence: 99%
“…1. Figure 1(a) is a SEM image, 15x15 µm 2 in size, exhibiting a well defined orientation of these cracks, running in the [001] direction (this was confirmed by directional resistance measurements 25,27 ). One can also observe larger surface defects, but these are well separated from each other (much more than the typical scan range in our STM measurements).…”
Section: Film Growthmentioning
confidence: 90%
“…A Pr 1 Ba 2 Cu 3 O 6-δ template was used in order to reduce misorientations, as described in Ref. 27. The films were examined using x-ray diffraction, which showed only peaks corresponding to the desired (110) orientation.…”
Section: Film Growthmentioning
confidence: 99%
“…͑1, 1, 0͒ oriented thin Y 1 Ba 2 Cu 3 O 72x films of various doping levels near the optimal doping were grown on ͑1, 1, 0͒ SrTiO 3 substrates, using rf and dc off-axis sputtering. A Pr 1 Ba 2 Cu 3 O 72x template was used in order to reduce the ͑1, 0, 3͒ orientations, following the method used by Poelders et al [8] Garcia Lopez et al [9] showed that the amount of oxygen loaded in the YBa 2 Cu 3 O 72x film during the growth can be controlled by changing the oxygen pressure and the amount of atomic and ionic oxygen in the plasma. In addition, they showed that the film remains oxidized if quenched at room temperature.…”
mentioning
confidence: 99%