1997
DOI: 10.1063/1.366251
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Transient tunneling current in laser-assisted scanning tunneling microscopy

Abstract: The transient tunneling current induced by pulsed laser irradiation of a scanning tunneling microscope (STM) tunneling gap was observed to occur over a 100 μs time scale range in response to a 20 ns duration of the laser pulse. The amplitude of the transient current varies exponentially with laser power, confirming our previous suggestion that thermal expansion of the STM tip is the main source of the transient increase of tunneling current. This thermal expansion mechanism is also supported by the observation… Show more

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Cited by 44 publications
(31 citation statements)
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“…The exact value of this relaxation time varies from tip to tip, but nevertheless all values observed in our experiments were above the time resolution of the amplifier (30 µs). Similar values for tungsten tips have also been observed by Lyubinetsky et al [7].…”
Section: Resultssupporting
confidence: 78%
See 1 more Smart Citation
“…The exact value of this relaxation time varies from tip to tip, but nevertheless all values observed in our experiments were above the time resolution of the amplifier (30 µs). Similar values for tungsten tips have also been observed by Lyubinetsky et al [7].…”
Section: Resultssupporting
confidence: 78%
“…On one hand field enhancement in the vicinity of the tip and subsequent field evaporation is proposed, while thermal effects are ruled out [1][2][3][4][5]. On the other hand mechanical contact as a result of thermal expansion is discussed as well [6][7][8]. Such thermal effects have also been observed in other combinations of pulsed laser light with scanning microscope tips [9][10][11].…”
mentioning
confidence: 82%
“…Hence, as the concepts of low-energy electron holography are compatible with ultrafast nanofocused SPP-driven electron sources, the prospective combination of sub-10 fs temporal and 1 nm spatial resolutions would enable the investigation of ultrafast charge transport on electronic time and molecular length scales. At tip-sample distances in the sub-nanometer range, SPP-driven electron point sources are promising probes for timeresolved scanning tunneling microscopy (STM), which has been pursued for more than two decades [36,38,55,56] but remains challenging due to laser-induced thermal expansion [57][58][59] and contribution of the transient hot electrons to the tunneling currents [39]. The non-local excitation of the optical near-field in the tip-sample junction via nanofocused SPPs may help to overcome these limitations.…”
Section: Resultsmentioning
confidence: 99%
“…[1][2][3][4][5][6][7] In many of these experiments, in which generally visible or infrared wavelengths are used, it is frequently considered that the various photoinduced effects such as electron-phonon coupling, 8,9 photovoltage, 10 thermovoltage, 11 photoelectron emission, 12 hot electron formation, 13 and tunnel current rectification 14 are decoupled. Thus, in many experiments, the optical-field confinement and enhancement that may be created underneath the STM-tip apex 15,16 is regularly considered as an independent optical process separated from the other photoinduced effects.…”
Section: Introductionmentioning
confidence: 99%