Transient perturbation analysis in digital radio

Jauregui, Ricardo; Pous, Marc; Fernández, María Belén; Silva, Ferran

doi:10.1109/isemc.2010.5711282

Cited by 8 publications

(4 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This indicator is applied before taking into account any other indicators, because its value determines whether or not to continue the validation process. Some studies (R Jauregui, Pous, Fernández, & Silva, 2010; determined that the optimal limit for a correct interpretation is when the FDM TOT indicator is equal or less than 0.8. This value ensures that the two data sets (numerical simulation and measurement, for example) have a similarity that is within the acceptable margin.…”

Section: For This Reason a Special Methods Was Developed To Performmentioning

confidence: 99%

Numerical Validation Methods

Jauregui¹,

Silva²

2011

Numerical Analysis - Theory and Application

View full text Add to dashboard Cite

Section: For This Reason a Special Methods Was Developed To Performmentioning

confidence: 99%

Numerical Validation Methods

Jauregui¹,

Silva²

2011

Numerical Analysis - Theory and Application

View full text Add to dashboard Cite

“…With the increase of electromagnetic (EM) pollution, the radio communicating devices can be affected by noisy transient signals occurred as unwanted electrical interferences [1][2][3]. Owing to these undesired EM effects, an estimation method was proposed in [4] for analysis of an effect related to the printed circuit board (PCB) radiation.…”

Section: Introductionmentioning

confidence: 99%

Fully Time-Domain Scanning of Em Near-Field Radiated by Rf Circuits

Liu¹,

Ravelo²

2014

PIER B

View full text Add to dashboard Cite

This paper deals with planar scanning technique of electromagnetic (EM) near-field (NF) emitted by electronic printed circuit boards (PCBs) fully in the time-domain (TD). The proposed EM scanning metrology is essentially based on the NF test bench available at the IRSEEM laboratory. It comprises motorized mechanical structures for moving the probe interconnected to electronic measurement instruments and controlled by a driver PC. The synoptic of the test bench is presented and technically examined. The characteristics of different elements constituting the measurement chain of the TD test bench understudy are described. The NF metrology developed is originally focused on the measurement of time-dependent magnetic field H(t) dedicated to the radiated emission electromagnetic compatibility (EMC) applications. An innovative calibration technique of the loop probe for detecting H(t) is established in order to ensure the post processing and extraction of the measured NF data. Then, validations were carried out via comparison with different simulations run with standard commercial tools. Mathematical analyses were also conducted for the improvement of the measurement post processing. To realize the mapping of time-dependent EM field components, a software interface edited with the graphical language LabVIEW was emulated to synchronize the probe displacement and the data acquisition. An UWB amplifier with average gain about 30 dB from DC to 300 MHz was designed and fabricated in order to decrease the measurement noise and to improve the quality of measured signals. As results of the study, TD NF mapping is demonstrated successfully by measuring the EM radiation emitted by electronic planar circuits. The technique developed is extremely useful in the field of EMC engineering for predicting the transient perturbations susceptible to degrade electronic functions in complex systems encountered usually for the automotive and aeronautic applications. 0 20 Time, ns E (z=5.05 mm, t=0.5 ns) z E (z=5.05 mm, t=1.5 ns) z E , V/m z E (z=5.05 mm, t=2.5 ns) z E (z=5.05 mm, t=3.5 ns) z E (t), y=5 mm z=5.05 mm z E (t), y= -5 mm z=5.05 mm z E (t), V/m z E (t), y=10 mm z=5.05 mm z E (t), y= -10 mm z=5.05 mm z E (t), V/m z E , V/m z E , V/m z E , V/m z E (t), V/m E (t), V/m z z Time, ns Time, ns H (z=5.05 mm, t=0.5 ns) z H (z=5.05 mm, t=1.5 ns) z H , V/m z E (z=5.05 mm, t=2.5 ns) z H (z=5.05 mm, t=3.5 ns) z E (t), y=5 mm z=5.05 mm z H (t), y= -5 mm z=5.05 mm z H (t), V/m z E (t), y=10 mm z=5.05 mm z H (t), y= -10 mm z=5.05 mm z H (t), V/m z H , V/m z H , V/m z H , V/m z

show abstract

“…This is why the time-domain EMC analyses and modelling are required. Till now, in our knowledge, few studies have been done on EM radiated emissions modelling in the time-domain [35][36][37][38][39][40][41][42][43][44][45]. This explains why we are motivated to conduct the timefrequency method for the treatment of the EM NF emission.…”

Section: Introductionmentioning

confidence: 99%

Application of Near-Field Emission Processing for Microwave Circuits under Ultra-Short Duration Perturbations

Liu

Ravelo

2012

AEM

View full text Add to dashboard Cite

This paper deals with the processing method of electromagnetic (EM) near-field (NF) radiated by microwave circuits with transient pulse signals. Two different NF processing methods are proposed by applying the time-frequency approach. First, a computation method of NF/NF transform is presented. This enables to calculate the EM NF maps at different distances from the radiating circuit. The feasibility of NF/NF in both frequency-and time-domain is verified with experimental results. Then, NF processing based on NF emission model implemented in UWB frequency band is also examined in the second part of the paper. For that, the number of EM NF maps representing the large band model is reduced in order to simplify the model based on a set of dipole-array. The timedomain model is implemented by considering the convolution of the transient excitation signals and the UWB dipole-array model. This time-frequency model was validated with a planar microstrip device excited by microwave signal modulating 1.25-GHz-carrier and 0.5-GHz-bandwidth. The methods explored in this paper are particularly useful for the investigation of time-domain emissions for EMC applications by considering transient EM interferences (EMIs).

show abstract

Transient perturbation analysis in digital radio

Cited by 8 publications

References 9 publications

Numerical Validation Methods

Numerical Validation Methods

Fully Time-Domain Scanning of Em Near-Field Radiated by Rf Circuits

Application of Near-Field Emission Processing for Microwave Circuits under Ultra-Short Duration Perturbations

Contact Info

Product

Resources

About