2011 IEEE 17th International on-Line Testing Symposium 2011
DOI: 10.1109/iolts.2011.5994536
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Towards improved survivability in safety-critical systems

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Cited by 17 publications
(14 citation statements)
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“…The exact analytical expressions of reliability and safety have been derived and evaluated on the interval [0, 200000] (flight hours), which is a typical lifetime of avionics systems [19,20]. Failure rates and coverage probabilities that have been used are given in Table 1.…”
Section: Numerical Resultsmentioning
confidence: 99%
“…The exact analytical expressions of reliability and safety have been derived and evaluated on the interval [0, 200000] (flight hours), which is a typical lifetime of avionics systems [19,20]. Failure rates and coverage probabilities that have been used are given in Table 1.…”
Section: Numerical Resultsmentioning
confidence: 99%
“…We consider platforms with m = [2,16] processors. On each processor, there can be up to 10 tasks, where n = [1,10].…”
Section: A System Settingmentioning
confidence: 99%
“…The transition from uniprocessors to multiprocessors has been taking place over the last few years to meet the increasing demand for computation power [2]. However, moving to multiprocessor platforms breaks most of the well-known locking protocols and schedulability analysis approaches that are used on uniprocessor platforms, which can only manage resources that are accessed from one processor (local resources).…”
Section: Introductionmentioning
confidence: 99%
“…Those semiconductor technologies needed for performance reasons, however, lead to an increased number of transient faults due to higher susceptibility to cosmic rays and alpha particles, as well as due to intermittent faults caused by small defects that grow enough due to degradation to produce faults under some particular environmental conditions (e.g., low voltage, high temperature) [3]. Permanent faults also arise either because defects grow enough until they cause permanent faults, or simply because they escaped post-silicon test [3].…”
Section: Introductionmentioning
confidence: 99%
“…Permanent faults also arise either because defects grow enough until they cause permanent faults, or simply because they escaped post-silicon test [3]. Transient and permanent faults lead to errors that can be tolerated to some extent in some markets, but cannot in CRTES where stringent correctness constraints call for means to prevent faults from jeopardising the safety of those systems.…”
Section: Introductionmentioning
confidence: 99%