2011
DOI: 10.1142/9789814322843_0013
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Time-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures

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Cited by 3 publications
(4 citation statements)
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“…The steady-state method and the transient hot-wire method can be used for bulk measurements. The 3ω method and time-domain thermoreflectance (TDTR) method can be used for thin film measurements. Recently, the TTG measurement has drawn attention as a new optical, in-plane thermal conductivity measurement. This setup has advantages over conventional methods in that high space and time resolution are obtained with little sample preparation and simple data interpretation.…”
Section: Methodsmentioning
confidence: 99%
“…The steady-state method and the transient hot-wire method can be used for bulk measurements. The 3ω method and time-domain thermoreflectance (TDTR) method can be used for thin film measurements. Recently, the TTG measurement has drawn attention as a new optical, in-plane thermal conductivity measurement. This setup has advantages over conventional methods in that high space and time resolution are obtained with little sample preparation and simple data interpretation.…”
Section: Methodsmentioning
confidence: 99%
“…The time domain thermoreflectance (TDTR) set up, as shown in Figure , relies on the fact that the reflectivity of aluminum has a measurable dependence on temperature. We used a Ti:sapphire mode-locked laser to produce a series of ∼100 fs optical pulses with a wavelength of 800 nm at a repetition rate of 80 MHz.…”
Section: Experimental Measurements With Tdtrmentioning
confidence: 99%
“…In this work, we study the k of polymer nanocomposites using the time-domain thermoreflectance (TDTR) technique to elucidate the confinement effects on k . By varying the molecular weight ( M w ) of polystyrene (PS) filled in a nanoporous organosilicate matrix with fixed pore size, we find that confinement enhances k .…”
mentioning
confidence: 99%
“…The film thicknesses of all the samples are over 500 nm, which are large enough to rule out the size effects on thermal conductivity. The k ’s of all of the samples are measured by the TDTR method, which is becoming one of the standard techniques for characterizing thermal properties of bulk and thin films using ultrafast lasers. We prepared 1 or 2 samples with centimeter size for each type and performed TDTR measurements on multiple spots for each sample. Details of these measurements are described in the SI.…”
mentioning
confidence: 99%