Ti‐Based Catalysts and Photocatalysts: Characterization and Modeling

Abstract

This perspective article aims to underline how cutting‐edge synchrotron radiation spectroscopies such as extended X‐ray absorption spectroscopy (EXAFS), X‐ray absorption near edge structure (XANES), high resolution fluorescence detected (HRFD) XANES, X‐ray emission spectroscopy (XES) and resonant inelastic X‐ray scattering (RIXS) have played a key role in the structural and electronic characterization of Ti‐based catalysts and photocatalysts, representing an important additional value to the outcomes of conventional laboratory spectroscopies (UV‐Vis, IR, Raman, EPR, NMR etc.). Selected examples are taken from the authors research activity in the last two decades, covering both band‐gap and shape engineered TiO2 materials and microporous titanosilicates (ETS‐10, TS‐1 and Ti−AlPO‐5). The relevance of the state of the art simulation techniques as a support for experiments interpretation is underlined for all the reported examples.