Three-dimensional high-resolution quantitative microscopy of extended crystals

Godard, Pierre; Carbone, Dina; Allain, Marc; Mastropietro, Francesca; Chen, G.; Capello, L.; Díaz, Ana; Metzger, T. H.; Stangl, J.; Chamard, Virginie

doi:10.1038/ncomms1569

Cited by 151 publications

(117 citation statements)

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“…[14,15], this new method is not one of pure Fourier synthesis in which the properties of the 3D reconstruction depend strictly on the measurement and sampling of a 3D volume of reciprocal space. Rather, the 2D structural information of the sample that is encoded in the q x , q y detector plane is used together with the real-space scanning probe positions to reconstruct the 3D sample structure.…”

Section: Principles Of the 3d Bragg Projection Ptychographymentioning

confidence: 99%

“…Thus, specific regions of interest can be imaged in continuous samples. As in the isolated crystal method, 3D images have been reconstructed from a 3D Fourier space intensity distribution about a Bragg peak [14,15]. Although this approach provides access to the internal strain distribution in targeted regions of nano-structured crystals [13], its implementation requires the measurement of diffraction patterns over a full angular rocking curve at each overlapping scan position, resulting in long measurement times and uncertainties with regard to registration.…”

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High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

et al. 2016

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We present an efficient method of imaging 3D nanoscale lattice behavior and strain fields in crystalline materials with a new methodology -three dimensional Bragg projection ptychography (3DBPP). In this method, the 2D sample structure information encoded in a coherent high-angle Bragg peak measured at a fixed angle is combined with the real-space scanning probe positions to reconstruct the 3D sample structure. This work introduces an entirely new means of three dimensional structural imaging of nanoscale materials and eliminates the experimental complexities associated with rotating nanoscale samples. We present the framework for the method and demonstrate our approach with a numerical demonstration, an analytical derivation, and an experimental reconstruction of lattice distortions in a component of a nanoelectronic prototype device.Inversion methods provide a powerful alternative to traditional objective-lens-based microscopy. Techniques that numerically invert coherent diffraction patterns into real space images have provided substantial gains in resolution and sensitivity in certain optical, electron, and x-ray microscopy experiments, especially where image-forming lenses are inefficient or difficult to incorporate. The resulting images, formed by inverting reciprocal space diffraction patterns, contain quantitative information that encodes local physical parameters such as permittivity, density, and atomic displacement at sub-beam-size spatial resolutions.When implemented with hard x-rays, these coherent diffraction imaging (CDI) techniques have enhanced our understanding of the internal structure of nano-and meso-scale materials, especially in operating environments that are difficult to access with other probes. Furthermore, x-ray microscopy methods based on Bragg diffraction are of particular interest because the sensitivity of x-rays to crystalline distortions in materials can be leveraged to reveal the interplay between structure and properties without disturbing environmental boundary conditions. However, the routine application of inversion methods to coherent hard x-ray Bragg diffraction is still limited by stringent experimental requirements and long measurement times.Given the potential impact of non-destructive 3D structural microscopy and the limitations of current 3D Bragg coherent x-ray inversion methods, advances in Bragg phase retrieval methods that facilitate the rapid imaging of crystal lattice behavior in realistic environments are critically important. Here, we introduce a new coherent Bragg diffraction imaging approach, three dimensional Bragg projection ptychography (3DBPP), that provides such a capability. 3DBPP enables 3D image reconstruction from a series of 2D Bragg diffraction patterns measured at a single incident beam angle, thus forming a new mode of inversion-based 3D strain-sensitive imaging. As we discuss in this article, 3DBPP is a hybrid real / reciprocal space technique that takes advantage of the high angle of separation between the incident and diffracted beam in a Bra...

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Section: Principles Of the 3d Bragg Projection Ptychographymentioning

confidence: 99%

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High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

et al. 2016

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“…Even with the advent of cold sources with improved coherence properties 18 , the lengths are still small compared with many samples of interest. Recently, new research avenues using CDI have been opened by the ability to image both crystalline 19 and non-crystalline 20 samples of arbitrary size in three dimensions using ptychography. The ability to perform these measurements at partially coherent sources (including lab-based X-ray 21 ) or to utilize more flux to reduce the lengthy data acquisition times will be of huge benefit to materials and biological sciences.…”

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High-resolution three-dimensional partially coherent diffraction imaging

et al. 2012

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The wave properties of light, particularly its coherence, are responsible for interference effects, which can be exploited in powerful imaging applications. Coherent diffractive imaging relies heavily on coherence and has recently experienced rapid growth. Coherent diffractive imaging recovers an object from its diffraction pattern by computational phasing with the potential of wavelength-limited resolution. Diminished coherence results in reconstructions that suffer from artefacts or fail completely. Here we demonstrate ab initio phasing of partially coherent diffraction patterns in three dimensions, while simultaneously determining the coherence properties of the illuminating wavefield. Both the dramatic improvements in image interpretability and the three-dimensional evaluation of the coherence will have broad implications for quantitative imaging of nanostructures and wavefield characterization with X-rays and electrons.

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“…Geometrical magnification can be achieved using Fresnel zone plates (Chao et al, 2005;Chu et al, 2008), resulting in very high resolution. Recently, ptychography has gained importance in the field of X-ray microscopy to achieve even smaller voxel size down to 10 nm (Dierolf et al, 2010;Godard et al, 2011;Schropp et al, 2012).…”

Section: Accepted Manuscriptmentioning

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High-resolution X-ray computed tomography in geosciences: A review of the current technology and applications

Cnudde

Boone

2013

Earth-Science Reviews

1,232

700

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Please cite this article as: Cnudde, V., Boone, M.N., "High-resolution X-ray computed tomography in geosciences: a review of the current technology and applications", Earth Science Reviews (2013Reviews ( ), doi: 10.1016Reviews ( /j.earscirev.2013 This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting proof before it is published in its final form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain.A C C E P T E D M A N U S C R I P T AbstractHigh-resolution X-ray Computed Tomography (HRXCT) or micro-CT (µCT) is a frequently used non-destructive 3D imaging and analysis technique for the investigation of internal structures of a large variety of objects, including geomaterials. Although the possibilities of X-ray micro-CT are becoming better appreciated in earth science research, the demands on this technique are also approaching certain physical limitations. As such, there remains a lot of research to be done in order to solve all the technical problems that occur when higher demands are put on the technique. In this paper, a review of the principle, the advantages and limitations of X-ray CT itself are presented, together with an overview of some current applications of micro-CT in geosciences. One of the main advantages of this technique is the fact that it is a non-destructive characterization technique which allows 4D monitoring of internal structural changes at resolutions down to a few hundred nanometers. Limitations of this technique are the operator dependency for the 3D image analysis from the reconstructed data, the discretations effects and possible imaging artefacts. Driven by the technological and computational progress, the technique is continuously growing as an analysis tool in geosciences and is becoming one of the standard techniques, as is shown by the large and still increasing number of publications in this research area. It is foreseen that this number will continue to rise, and micro-CT will become an indispensable technique in the field of geosciences.

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Three-dimensional high-resolution quantitative microscopy of extended crystals

Cited by 151 publications

References 27 publications

High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography

High-resolution three-dimensional partially coherent diffraction imaging

High-resolution X-ray computed tomography in geosciences: A review of the current technology and applications

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