1999
DOI: 10.1143/jjap.38.3604
|View full text |Cite
|
Sign up to set email alerts
|

Abstract: In this paper, real electrical trees in polymeric insulating materials were discussed from the viewpoint of their fractal characteristics. Experiments on real electrical trees were carried out in the needle to plane electrode geometry under ac voltage application. Samples in this investigation were made of cross-linked polyethylene (XLPE). Two methods of reconstructing three-dimensional (3D) patterns of real electrical trees were developed. One is the computerized tomography method … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
5
0

Year Published

2014
2014
2015
2015

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(5 citation statements)
references
References 9 publications
0
5
0
Order By: Relevance
“…Three-dimensional models (or 'virtual replicas') from 'real' (rather than simulated) electrical trees have been generated using the imaging techniques of X-ray computed tomography (XCT) and serial block-face scanning electron microscopy (SBFSEM) [15,16]. In the past, optical microscopy combined with either computed tomography or serial sectioning methods were used to reconstruct the structure of trees [17]. However, optical tomography cannot resolve complex trees and optical microscopy is limited in resolution.…”
Section: Geometric Three-dimensional Tree Reconstructionmentioning
confidence: 99%
See 1 more Smart Citation
“…Three-dimensional models (or 'virtual replicas') from 'real' (rather than simulated) electrical trees have been generated using the imaging techniques of X-ray computed tomography (XCT) and serial block-face scanning electron microscopy (SBFSEM) [15,16]. In the past, optical microscopy combined with either computed tomography or serial sectioning methods were used to reconstruct the structure of trees [17]. However, optical tomography cannot resolve complex trees and optical microscopy is limited in resolution.…”
Section: Geometric Three-dimensional Tree Reconstructionmentioning
confidence: 99%
“…Recent research has allowed complete three dimension (3D) replicas of trees to be generated using both X-ray computed tomography (XCT) and serial block-face scanning electron microscopy (SBSEM) [15,16]. The use of these methods enables the measurement and calculation of many quantities which characterize the tree: for example, parameters such as the diameter of tree channels, tree volume and surface area, and 3D fractal dimension [17]. Also, parameters from the skeleton of the tree can be obtained: number of vertices and segments, segment lengths, branch angles and tortuosity of the channels, amongst others.…”
Section: Introductionmentioning
confidence: 99%
“…In the past, optical microscopy combined with either computed tomography or serial sectioning methods were used to reconstruct the structure of trees [17]. However, optical tomography cannot resolve complex trees and optical microscopy is limited in resolution.…”
Section: Geometric Three-dimensional Tree Reconstructionmentioning
confidence: 99%
“…The use of these methods enables the measurement and calculation of many quantities which characterize the tree: for example, parameters such as the diameter of tree channels, tree volume and surface area, and 3D fractal dimension [17]. Also, parameters from the skeleton of the tree can be obtained: number of vertices and segments, segment lengths, branch angles and tortuosity of the channels, amongst others.…”
Section: Introductionmentioning
confidence: 99%
“…In the past, 3D images of electrical trees in translucent XLPE have been generated using computed tomography and serial-sectioning methods combined with optical microscopy [9]. However, XCT and SBFSEM techniques have the capability of inspecting the internal structure of optically-opaque materials too.…”
Section: Introductionmentioning
confidence: 99%