Thickness and substrate dependence
of film growth, morphology,
unit-cell structure, and electronic structures was thoroughly investigated
for picene, the zigzag connected 5-ring molecule, by employing complementary
techniques of in situ real-time X-ray reflectivity/diffraction, in situ electron spectroscopies, and atomic force microscopy.
A different kind of thickness dependent structural transition was
observed on SiO2 and graphite, resulting in a distinct
electronic structure. On SiO2 picene films with 3D crystalline
domains are formed with nearly upright molecular orientation from
the initial growth stage. With increasing the film thickness the in-plane
dimensions of the unit cell in the initially grown domains become
smaller (in other words, more compressed), and, at the same time,
crystalline domains with a more relaxed structure are nucleating on
top of the compressed domains. In spite of such structural changes,
the electronic structure, namely energy position of the highest occupied
molecular orbital and threshold ionization potential (IPT), is not significantly altered. On graphite, on the other hand,
we found a transition from a 2D (layer) to a 3D (island) growth mode
with a variation of the molecular orientation from flat-lying to tilted
one. The IPT changes significantly between the 2D and 3D
growth regime in contrast to the SiO2 system. The origin
of the different IPTs of these picene thin films is discussed.
The present results are compared with other planar π-conjugated
compounds, in particular pentacene which is a structural isomer of
picene and shows electronic properties strongly different from picene
thin films.