2011
DOI: 10.1103/physrevb.84.073109
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Thickness-dependent bulk properties and weak antilocalization effect in topological insulator Bi2Se3

Abstract: We show that a number of transport properties in topological insulator (TI) Bi 2 Se 3 exhibit striking thickness-dependences over a range of up to five orders of thickness (3 nm -170 µm). Volume carrier density decreased with thickness, presumably due to diffusion-limited formation of selenium vacancies. Mobility increased linearly with thickness in the thin film regime and saturated in the thick limit. The weak anti-

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Cited by 298 publications
(310 citation statements)
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“…In contrast to previous studies of WAL in TI thin films [15][16][17][18][19][20][21][22] where strong surface to bulk scattering dominates inter-channel coupling, here we report WAL measurements in gate-tuned, bulkinsulating Bi 2 Se 3 thin films where we expect negligible surfacebulk scattering. We find that the WAL behaviour in TI regime is governed by the ratio of t j to the inter-surface tunnelling time t t ¼ h/2D, where h is Planck's constant and D is the hybridization gap induced by inter-surface tunnelling 12,14 .…”
mentioning
confidence: 48%
“…In contrast to previous studies of WAL in TI thin films [15][16][17][18][19][20][21][22] where strong surface to bulk scattering dominates inter-channel coupling, here we report WAL measurements in gate-tuned, bulkinsulating Bi 2 Se 3 thin films where we expect negligible surfacebulk scattering. We find that the WAL behaviour in TI regime is governed by the ratio of t j to the inter-surface tunnelling time t t ¼ h/2D, where h is Planck's constant and D is the hybridization gap induced by inter-surface tunnelling 12,14 .…”
mentioning
confidence: 48%
“…Figure 2(d) shows the STM topography of a nominal 3QL thick film with flat terraces and 1 nm step heights, corresponding to one QL. Figure 3(a) shows the two-terminal resistance measured during sample cool-down, which displays an insulating behavior with resistance increasing about two orders of magnitude between room temperature and 5 K. Similar insulating behavior has always been seen in ultrathin Bi 2 Se 3 films, which could be due to strong interactions [25], or Anderson localization [26,27]. To test the gating ability of the TI/STO device, we measured the 2-terminal resistance through the 3QL film vs. gate voltage (Fig.…”
mentioning
confidence: 88%
“…This is because the top and bottom surfaces are connected though the bulk channel to form a single diffusive transport channel. 173,186,[235][236][237] Remember, as long as the thickness is shorter than L which is usually of the order of 100-1000 nm in TIs, electrons can diffusively travel from the bottom surface state to the top surface state though the bulk state using three different Fermi surfaces without losing the phase memory. Figure 19 shows an example of the weak antilocalization behavior observed in a series of MBE-grown Bi 2 Se 3 thin films with varying thickness, in which % À1=2 was consistently observed unless the films are too thin.…”
Section: Weak Anti-localization Effectmentioning
confidence: 99%