2005
DOI: 10.1016/j.tsf.2004.08.117
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Thermoelectric properties and electrical characteristics of sputter-deposited p-CuAlO2 thin films

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Cited by 127 publications
(70 citation statements)
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“…Also, activation energy values were obtained from a temperature variation of the conductivity measurements of the individual films. These values were 550 meV and 270 meV for n-and p-layers, respectively, which were presented in our earlier literature [16,19] and also furnished in Table 1. Taking into consideration all of these values, the approximate depletion barrier height of the diode comes out to be ∼1.7 eV (as shown in Fig.…”
Section: Resultssupporting
confidence: 66%
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“…Also, activation energy values were obtained from a temperature variation of the conductivity measurements of the individual films. These values were 550 meV and 270 meV for n-and p-layers, respectively, which were presented in our earlier literature [16,19] and also furnished in Table 1. Taking into consideration all of these values, the approximate depletion barrier height of the diode comes out to be ∼1.7 eV (as shown in Fig.…”
Section: Resultssupporting
confidence: 66%
“…3. Electrical properties of the individual layers have been studied in detail and represented in our previous literature [16][17][18][19][20]. A comparative study of different electrooptical properties of the individual films is furnished in Table-1.…”
Section: Resultsmentioning
confidence: 99%
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“…Moreover, with regard to high temperature applications and the use of non-toxic elements in thermoelectric material, many recent researches have focused on oxide thermoelectric materials containing the TiO 2 system. 5,[21][22][23][24] Moreover, it is understood that the principal factor in the increase in the thermoelectric properties of oxide thermoelectric materials is the decrease in electrical resistivity.…”
Section: Introductionmentioning
confidence: 99%