The Separation of Cold-Work Distortion and Particle Size Broadening in X-Ray Patterns

Warren, Β. E.; Averbach, B.L.

doi:10.1063/1.1702234

Cited by 567 publications

(215 citation statements)

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“…The scanning range for 2θ was set to 6-45°to cover all the significant diffraction peaks of sample crystallites with a scan speed of 3°/min. A single order method based on WarrenAverbach (Warren and Averbach 1952) Fourier theory was used to compute the crystallites size from the broadening of X-ray reflection. For this purpose, a known analytical function for crystal size distribution was used (Somashekarappa et al 1999;Singh et al 2006).…”

Section: X-ray Diffractometrymentioning

confidence: 99%

Effect of processing on the microstructure of finger millet by X-ray diffraction and scanning electron microscopy

et al. 2011

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Finger millet is one of the important minor cereals, and carbohydrates form its major chemical constituent. Recently, the millet is processed to prepare hydrothermally treated (HM), decorticated (DM), expanded (EM) and popped (PM) products. The present research aims to study the changes in the microstructure of carbohydrates using X-ray diffraction and scanning electron microscopy. Processing the millet brought in significant changes in the carbohydrates. The native millet exhibited A-type pattern of X-ray diffraction with major peaks at 2θ values of 15.3, 17.86 and 23.15°, whereas, all other products showed V-type pattern with single major peak at 2θ values ranging from 19.39 to 19.81°. The corresponding lattice spacing and the number of unit cells in a particular direction of reflection also reduced revealing that crystallinity of starch has been decreased depending upon the processing conditions. Scanning electron microscopic studies also revealed that the orderly pattern of starch granules changed into a coherent mass due to hydrothermal treatment, while high temperature short time treatment rendered a honey-comb like structure to the product. However, the total carbohydrates and non-starch polysaccharide contents almost remained the same in all the products except for DM and EM, but the individual carbohydrate components changed significantly depending on the type of processing.

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Section: X-ray Diffractometrymentioning

confidence: 99%

Effect of processing on the microstructure of finger millet by X-ray diffraction and scanning electron microscopy

et al. 2011

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“…This is a simple method, but accurate only to the order of magnitude. However, since Scherrer's work, line profile analysis has made enormous progress 21,22,23,24,25,26,27,28,29,30 .…”

Section: Powder Patterns and Size Informationmentioning

confidence: 99%

Nanoparticle size distribution estimation by a full-pattern powder diffraction analysis

et al. 2005

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The increasing scientific and technological interest in nanoparticles has raised the need for fast, efficient and precise characterization techniques. Powder diffraction is a very efficient experimental method, as it is straightforward and non-destructive. However, its use for extracting information regarding very small particles brings some common crystallographic approximations to and beyond their limits of validity. Powder pattern diffraction calculation methods are critically discussed, with special focus on spherical particles with log-normal distribution, with the target of determining size distribution parameters. A 20-nm CeO2 sample is analyzed as example.

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“…From (5) and the order independence of AS(L), the WA analysis is derived from taking the logarithm on both sides of (2) (Warren & Averbach, 1952): …”

Section: A the Warren-averbach Analysismentioning

confidence: 99%

Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening

Berkum¹,

Vermeulen²,

Delhez³

et al. 1994

J Appl Crystallogr

107

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The validities of the Warren-Averbach analysis and of an alternative analysis for separation of size and strain contributions to diffraction line broadening are investigated. The analyses are applied to simulated and experimental line profiles. The Fourier coefficients of the simulated line profiles are derived from expressions for the distortion field around specific lattice defects: misfitting inclusions and small-angle grain boundaries. Applicability tests are also performed on experimental powder diffraction line profiles taken from plastically deformed specimens: thin aluminium layers and ball-milled molybdenum powders. It is concluded that for both methods finite but different classes of specimen exist for which they give meaningful results. In practice, each time an analysis is performed the results must be tested against common (physical) sense and all information available on the specimens.

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The Separation of Cold-Work Distortion and Particle Size Broadening in X-Ray Patterns

Cited by 567 publications

References 1 publication

Effect of processing on the microstructure of finger millet by X-ray diffraction and scanning electron microscopy

Effect of processing on the microstructure of finger millet by X-ray diffraction and scanning electron microscopy

Nanoparticle size distribution estimation by a full-pattern powder diffraction analysis

Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening

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