1998
DOI: 10.1063/1.121208
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The Schottky energy barrier dependence of charge injection in organic light-emitting diodes

Abstract: Analysis of metal-oxide-based charge generation layers used in stacked organic light-emitting diodes

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Cited by 103 publications
(63 citation statements)
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“…The formation of Schottky barrier between metal electrode and organic electronics materials has been extensively studied both theoretically [71][72][73] and experimentally [74][75][76][77] in recent years. In addition, the application of SAMs (Self Assembled Monolayers) of π-conjugated thiols for single-molecule electronics have been extensively studied [78].…”
Section: Metal-molecule Interfacementioning
confidence: 99%
“…The formation of Schottky barrier between metal electrode and organic electronics materials has been extensively studied both theoretically [71][72][73] and experimentally [74][75][76][77] in recent years. In addition, the application of SAMs (Self Assembled Monolayers) of π-conjugated thiols for single-molecule electronics have been extensively studied [78].…”
Section: Metal-molecule Interfacementioning
confidence: 99%
“…These assumptions can be relaxed; we plan to do so in future work. For example, the mobility can be adjusted to account for the electric field through the functional formμ =μ 0 exp Ê /Ê 0 , whereμ 0 andÊ 0 are material parameters [7].…”
Section: Discussionmentioning
confidence: 99%
“…The energy barrier to injection across the MEH-PPV/Ca interface is approximately 0.1 eV, which indicates a space-charge-limited OLED [7]. Specifically, Parker reports current-voltage curves for OLEDs for varying widths of the polymer thin film,L.…”
Section: Comparison Between Asymptotic Analysis and Numerical Solutiomentioning
confidence: 99%
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“…In both cases, a static field of 10 kV/cm is applied. At such low field charge injection effects are negligible, 14 and only photocurrent is observed. Photoexcitation is accomplished with 400 nm ͑3 eV͒ laser pulses with durations of 180 fs [full width at half maximum (FWHM)], allowing above band gap excitation of both GaAs and MEH-PPV [1.6 (Ref.…”
mentioning
confidence: 99%